Functional test generation using binary decision diagrams

Approaches to Test Set Generation Using Binary Decision Diagrams

Approaches to Test Set Generation Using Binary Decision Diagrams. (December 2003) James Wingfield, B.S., Texas A&M University Chair of Advisory Committee: Dr. M. Ray Mercer This research pursues the use of powerful BDD-based functional circuit analysis to evaluate some approaches to test set generation. Functional representations of the circuit allow the measurement of information about faults ...

Test Pattern Generation for Multiple Stuck-at Faults Using Zero Suppressed Binary Decision Diagrams

Using Ordered Partial Decision Diagrams for Manufacture Test Generation

Using Ordered Partial Decision Diagrams for Manufacture Test Generation. (December 2003) Bradley Douglas Cobb, B.S., Texas A&M University Chair of Advisory Committee: Dr. M. Ray Mercer Because of limited tester time and memory, a primary goal of digital circuit manufacture test generation is to create compact test sets. Test generation programs that use Ordered Binary Decision Diagrams (OBDDs) ...

Equational Binary Decision Diagrams Equational Binary Decision Diagrams

We incorporate equations in binary decision diagrams (BDD). The resulting objects are called EQ-BDDs. A straightforward notion of ordered EQ-BDDs (EQ-OBDD) is de ned, and it is proved that each EQ-BDD is logically equivalent to an EQ-OBDD. Moreover, on EQ-OBDDs satis ability and tautology checking can be done in constant time. Several procedures to eliminate equality from BDDs have been reporte...

Program Analysis Using Binary Decision Diagrams

A fundamental problem in interprocedural program analyses is the need to represent and manipulate collections of large sets. Binary Decision Diagrams (BDDs) are a data structure widely used in model checking to compactly encode large state sets. In this dissertation, we develop new techniques and frameworks for applying BDDs to program analysis, and use our BDD-based analyses to gain new insigh...